Laser-Induced Breakdown Spectroscopy for the analysis of model samples of historical paintings

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Authors

POSPÍŠILOVÁ Eva NOVOTNÝ Karel ŠEVČÍK Richard KAISER Jozef POŘÍZKA Pavel HRADIL David HRADILOVÁ Janka

Year of publication 2016
Type Conference abstract
MU Faculty or unit

Faculty of Science

Citation
Description Laser-Induced Breakdown Spectroscopy (LIBS) has a high potential in the analysis of the objects of cultural heritage1. However it is a microdestructive technique and it is essential to optimize effects of laser-matter interaction and laser ablation on the particular material under investigation. Model multilayered samples containing traditional pigments were prepared on a wooden support (5 x 10 cm) with each layer partly revealed. Influence of the parameters, especially of the laser energy, on the depth profile and the crater size was observed and evaluated. Broadband spectra were first acquired using Sci-Trace instrument (AtomTrace, Czech Republic) equipped with echelle spectrometer Emu-65 (Catalina Scientific, USA) and EMCCD camera (Falcon Blue, Raptor Photonics, IE). Significant element lines were chosen and samples were then re-measured using modified ablation system New Wave UP-266 MACRO equipped with Czerny Turner monochromator (TRIAX 320, Jobin Yvon, France) and an ICCD detector (PI max 3, Princeton Inst., USA). Obtained spectra were processed to create the depth profiles of the samples. The model sample (Fig. 1) consisted of four layers, with first layer composed of CaCO3 + CaSO4.0.5 H2O in organic binder, second layer of organic binder, third layer of cobalt glass + 2CuCO3.Cu(OH)2 in organic binder and the fourth of carmine lake (+ KAl(SO4)2.12 H2O + K2CO3) in organic binder was analysed. 30 laser shots were applied to one point and individual spectra were obtained for each shot. Particular element lines were chosen – Ca II 396.8 nm for the first layer, Cu I 324.7 nm for the third layer and Al I 396.2 nm for the fourth layer. The course of the depth profile processed from the spectra of these elements corresponds to their presence in each individual layer.
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