Introducing force traceability to nanoindentation measurements
| Authors | |
|---|---|
| Year of publication | 2021 |
| Type | Article in Proceedings |
| Conference | NANOCON 2020: 12th International Conference on Nanomaterials - Research & Application |
| MU Faculty or unit | |
| Citation | |
| Web | https://doi.org/10.37904/nanocon.2020.3774 |
| Doi | http://dx.doi.org/10.37904/nanocon.2020.3774 |
| Keywords | Nanoindentation; traceability; force calibration; indentation modulus; hardness |
| Description | We present a simple and portable setup for basic characterization of force sensors in nanoindentation instruments. The device can provide traceability to mass standards in the milli- and centinewton range. We present its use with a real nanoindentation instrument. Motivated by the result, we conduct a small computational study to demonstrate the effect of sensor measurement error on material properties quantified from nanoindentation measurements. |
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