Quantitative analysis of strain relaxation and mosaicity in short period Si m Ge n superlattices using reciprocal space mapping by x-ray diffraction

Warning

This publication doesn't include Faculty of Education. It includes Faculty of Science. Official publication website can be found on muni.cz.
Authors

KOPPENSTEINER E. HOLÝ Václav

Year of publication 1994
Type Article in Periodical
Magazine / Source Solid-State Electronics
MU Faculty or unit

Faculty of Science

Citation
Field Solid matter physics and magnetism
Related projects:

You are running an old browser version. We recommend updating your browser to its latest version.