Quantitative analysis of strain relaxation and mosaicity in short period Si m Ge n superlattices using reciprocal space mapping by x-ray diffraction

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Authors	KOPPENSTEINER E. HOLÝ Václav
Year of publication	1994
Type	Article in Periodical
Magazine / Source	Solid-State Electronics
MU Faculty or unit	Faculty of Science
Citation
Field	Solid matter physics and magnetism
Related projects:	Physical properties of new materials and layered structures