Spektrální elipsometrická charakterizace tenkých epitaxních vrstev Si_(1-x)Ge_x

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Title in English Spectroellipsometric characterization of thin epitaxial Si_(1-x)Ge_x lazers
Authors

LÍBEZNÝ Milan CAYMAX M. BRABLEC Antonín KUBĚNA Josef HOLÝ Václav

Year of publication 1994
Type Chapter of a book
MU Faculty or unit

Faculty of Science

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