Interface study of W-Si/Si and obliquely deposided W/Si multilayers by grazing-incidence high-resolution x-ray diffraction

Warning

This publication doesn't include Faculty of Education. It includes Faculty of Science. Official publication website can be found on muni.cz.
Authors

JERGEL M. HOLÝ Václav

Year of publication 1995
Type Article in Periodical
Magazine / Source J. Phys. D: Appl. Phys.
MU Faculty or unit

Faculty of Science

Citation
Field Solid matter physics and magnetism
Related projects:

You are running an old browser version. We recommend updating your browser to its latest version.