Temperature dependence of ellipsometric spectra of poly(methyl-phenylsilane)

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Authors

BONAVENTUROVÁ ZRZAVECKÁ Olga NEBOJSA Alois NAVRÁTIL Karel NEŠPŮREK Stanislav HUMLÍČEK Josef

Year of publication 2004
Type Article in Periodical
Magazine / Source Thin Solid Films
MU Faculty or unit

Faculty of Science

Citation
Field Solid matter physics and magnetism
Keywords temperature; ellipsometric spectra; poly(methyl-phenylsilane);
Description Comprehensive study of the temperature dependence of ultraviolet-visible ellipsometric spectra of thin films of poly(methyl-phenylsilane). It was found the threshold of irreversible changes of its optical response at 373 K and furthermore the average temperature shift of the lowest excitonic band in the reversible regime.The effect of annealing below and above 373 is studied with low- a high-level of the exposure to UV light.
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