Near-field scanning optical microscope probe analysis

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Authors

KLAPETEK Petr BURŠÍK Jiří VALTR Miroslav MARTÍNEK Jan

Year of publication 2008
Type Article in Periodical
Magazine / Source Ultramicroscopy
MU Faculty or unit

Faculty of Science

Citation
Doi http://dx.doi.org/10.1016/j.ultramic.2007.10.014
Field Optics, masers and lasers
Keywords NSOM;Artifacts
Description In this article results of a comparison of two NSOM probe characterization methods are presented. Scanning electron microscopy analysis combined with electromagnetic field modeling using the finite difference in time domain method are compared with measured far-field radiation diagrams of NSOM probes. It is shown that measurement of far-field radiation diagrams can be an efficient tool for daily checking of the NSOM probes quality. Moreover, it is shown that the inner probe geometry has large influence on the directional radiation of an NSOM probe and the far-field radiation diagram can be used as a simple method to distinguish between different probe geometries.
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