Comparison of AFM and optical methods at measuring nanometric surface roughness

Investor logo
Investor logo

Warning

This publication doesn't include Faculty of Education. It includes Faculty of Science. Official publication website can be found on muni.cz.
Authors

OHLÍDAL Ivan FRANTA Daniel OHLÍDAL Miloslav VIČAR Martin KLAPETEK Petr

Year of publication 1998
Type Article in Proceedings
Conference Proceedings of the 3th Seminar on Quantitative Microscopy
MU Faculty or unit

Faculty of Science

Citation
Web http://hydra.physics.muni.cz/~franta/bib/PTBF34_123.html
Field Solid matter physics and magnetism
Description In this contribution a comparison of the values of basic quantities characterizing random nanometric surface roughness determined by AFM and optical methods is presented.
Related projects:

You are running an old browser version. We recommend updating your browser to its latest version.