Atomic force microscopy characterization of ZnTe epitaxial films

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Authors	KLAPETEK Petr OHLÍDAL Ivan FRANTA Daniel MONTAIGNE-RAMIL Alberto BONANNI Alberta STIFTER David SITTER Helmut
Year of publication	2003
Type	Article in Periodical
Magazine / Source	Acta Physica Slovaca
MU Faculty or unit	Faculty of Science
Citation
Web	http://hydra.physics.muni.cz/~franta/bib/APS53_223.html
Field	Solid matter physics and magnetism
Keywords	OPTICAL METHODS; THIN-FILMS; GOLD
Description	In this paper results of a characterization of the surfaces of ZnTe epitaxial thin films exhibiting the different thicknesses are presented. The results mentioned are obtained using the procedures enabling us to determine the values of the following quantities: mean grain size, grain size distribution, root-mean square values of the heights of the irregularities and the diagram describing the distribution of the directions of the normals. For the analysis of the grain structure a watershed algorithm is used. It is shown that the values of these quantities can describe the morphology of the ZnTe film surfaces in a sufficient way. Further, it is shown that the structure of the surfaces of the ZnTe films exhibit facets forming a grain structure. Moreover, it is presented that the ZnTe film surfaces exhibit a strong slope anisotropy and that the linear dimensions of the grains increase with increasing values of the thicknesses of the ZnTe films.
Related projects:	Study of plasmachemical reactions in non-isothermic low pressure plasma and its interaction with the surface of solid substrates