Aplikace mikroskopie atomové síly při analýze tenkých vrstev ZnSe a ZnTe

Warning

This publication doesn't include Faculty of Education. It includes Faculty of Science. Official publication website can be found on muni.cz.

Title in English	Application of Atomic Force Microscopy for Analysis of ZnSe and ZnTe Thin Films
Authors	OHLÍDAL Ivan KLAPETEK Petr FRANTA Daniel
Year of publication	2003
Type	Article in Periodical
Magazine / Source	Československý časopis pro fyziku
MU Faculty or unit	Faculty of Science
Citation
Web	http://hydra.physics.muni.cz/~franta/bib/CCF53_97.html
Field	Solid matter physics and magnetism
Keywords	AFM; ZnSe; ZnTe
Description	Semiconductor layer ..
Related projects:	Realisation of thelaboratory instrument for surface roughness measurement by holographic interferometry Optical and mechanical properties of DLC : Si thin films prepared by the PECVD method