Project information
Optical and mechanical properties of DLC : Si thin films prepared by the PECVD method
- Project Identification
- GA202/01/1110
- Project Period
- 1/2001 - 1/2003
- Investor / Pogramme / Project type
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Czech Science Foundation
- Standard Projects
- MU Faculty or unit
- Faculty of Science
- Cooperating Organization
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Brno University of Technology
Czech Meteorological Institute
- Responsible person RNDr. Pavel Klenovský
The aim of this project is to perform the systematic study of the optical and mechanical properties of diamond like carbon (DLC) thin films containing silicon (DLC:Si). Within this study a new optical method based on combining spectroscopic ellipsometry and spectroscopic reflectometry will be used to determine the optical parameters of the thin films studied. Within this method the model respecting defects of the DLC:Si together with the new model of dispersion of the optical constants of these films wi ll be employed. Using the standard microindentation methods and modem nanoindentation ones the mechanical properties of the films will be investigated. A modification of holographic interferometry will be employed for measuring the distribution of the in ternal stresses inside the films investigated. Moreover, the influence of technological conditions of preparing the DLC:Si films on their optical and mechanical properties will be studied systematically. Practical conclusions will be implied from the stu
Publications
Total number of publications: 20
2004
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Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation
Microchimica Acta, year: 2004, volume: 147, edition: 3
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Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces
Ultramicroscopy, year: 2004, volume: 102, edition: 1
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Optical Properties of Diamond-Like Carbon Films Containing SiOx Studied by the Combined Method of Spectroscopic Ellipsometry and Spectroscopic Reflectometry
Thin Solid Films, year: 2004, volume: 455-456, edition: 1
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Optical properties of ZnTe films prepared by molecular beam epitaxy
Thin Solid Films, year: 2004, volume: 468, edition: 1-2
2003
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Aplikace mikroskopie atomové síly při analýze tenkých vrstev ZnSe a ZnTe
Československý časopis pro fyziku, year: 2003, volume: 53, edition: 2
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Atomic force microscopy characterization of ZnTe epitaxial thin films
Japanese Journal of Applied Physics, year: 2003, volume: 42, edition: 7B
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Effect of the Discharge Conditions on the Mechanical Properties of the Plasma Deposited DLC:SiOx Films
Proceedings of SAPP XIV, year: 2003
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Characterization of thin films non-uniform in optical parameters by spectroscopic digital reflectometry
Proceedings of SPIE, year: 2003, volume: 5182, edition: 2
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New Dispersion Model of the Optical Constants of the DLC Films
Acta Physica Slovaca, year: 2003, volume: 53, edition: 5
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New Method for the Complete Optical Analysis of Thin Films Nonuniform in Optical Parameters
Japanese Journal of Applied Physics, year: 2003, volume: 42, edition: 7B