Optical properties of ZnTe films prepared by molecular beam epitaxy

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Authors

FRANTA Daniel OHLÍDAL Ivan KLAPETEK Petr MONTAIGNE-RAMIL Alberto BONANNI Alberta STIFTER David SITTER Helmut

Year of publication 2004
Type Article in Periodical
Magazine / Source Thin Solid Films
MU Faculty or unit

Faculty of Science

Citation
Web http://hydra.physics.muni.cz/~franta/bib/TSF468_193.html
Field Solid matter physics and magnetism
Keywords THIN-FILMS; ROUGH BOUNDARIES; SUBSTRATE; GAAS; DEPENDENCE; CONSTANTS
Description In this paper, the optical properties of ZnTe epitaxial thin films prepared by molecular beam epitaxy (MBE) onto GaAs single crystal substrates are studied using the combined optical method employing a simultaneous interpretation of experimental data obtained by means of variable angle spectroscopic ellipsometry (VASE) and near-normal spectroscopic rellectometry (NNSR). The spectral dependences of both the optical constants, i.e. the refractive index and extinction coefficient, characterizing these films are presented within the spectral region 230-850 nm. It is shown that the optical properties of the ZnTe epitaxial films depend on the values of their thickness. This conclusion was found using the model of the optical constants exhibiting a profile across these films. A roughness of the upper boundaries of the ZnTe films and the existence of a very thin native oxide layer (NOL) on these boundaries are taken into account within the optical analysis.
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