Project information
Optical and mechanical properties of DLC : Si thin films prepared by the PECVD method
- Project Identification
- GA202/01/1110
- Project Period
- 1/2001 - 1/2003
- Investor / Pogramme / Project type
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Czech Science Foundation
- Standard Projects
- MU Faculty or unit
- Faculty of Science
- Cooperating Organization
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Brno University of Technology
Czech Meteorological Institute
- Responsible person RNDr. Pavel Klenovský
The aim of this project is to perform the systematic study of the optical and mechanical properties of diamond like carbon (DLC) thin films containing silicon (DLC:Si). Within this study a new optical method based on combining spectroscopic ellipsometry and spectroscopic reflectometry will be used to determine the optical parameters of the thin films studied. Within this method the model respecting defects of the DLC:Si together with the new model of dispersion of the optical constants of these films wi ll be employed. Using the standard microindentation methods and modem nanoindentation ones the mechanical properties of the films will be investigated. A modification of holographic interferometry will be employed for measuring the distribution of the in ternal stresses inside the films investigated. Moreover, the influence of technological conditions of preparing the DLC:Si films on their optical and mechanical properties will be studied systematically. Practical conclusions will be implied from the stu
Publications
Total number of publications: 20
2003
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Optical constants of ZnTe and ZnSe epitaxial thin films
Acta Physica Slovaca, year: 2003, volume: 53, edition: 2
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Optical properties of diamond-like carbon films containing SiOx
Diamond and Related Materials, year: 2003, volume: 12, edition: 9
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Srovnání snímků NSOM a AFM při studiu vybraných objektů
Československý časopis pro fyziku, year: 2003, volume: 47, edition: 6-7s
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Theoretical analysis of the atomic force microscopy characterization of columnar thin films
Ultramicroscopy, year: 2003, volume: 94, edition: 1
2002
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Analysis of the boundaries of ZrO2 and HfO2 thin films by atomic force microscopy and the combined optical method
Surface and Interface Analysis, year: 2002, volume: 34, edition: 1
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Applications of atomic force microscopy for thin film boundary measurements
Jemná mechanika a optika, year: 2002, volume: 47, edition: 6-7
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Estimation of the Surface Free Energy of Diamond-like Carbon Films
Chemicke listy, year: 2002, volume: 2002, edition: 96(S)
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Improvement of the efficiency of the silicon solar cells by silicon incorporated diamond-like carbon antireflective coatings
Journal of Non-Crystalline Solids, year: 2002, volume: 2002, edition: 299-302
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Optical characterization of diamond like carbon films using multi-sample modification of variable angle spectroscopic ellipsometry
Diamond and Related Materials, year: 2002, volume: 11, edition: 1
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Optical characterization of thin films non-uniform in thickness by a multiple-wavelength reflectance method
Surface and Interface Analysis, year: 2002, volume: 34, edition: 1